Extremely Low Magnification EBSD with an FE-SEM

Cryogenic EBSD on ice: preserving a stable surface in a low pressure SEM.

Naturally deformed ice contains subgrains with characteristic geometries that have recently been identified in etched surfaces using high-resolution light microscopy (LM). The probable slip systems responsible for these subgrain boundary types can be determined using electron backscattered diffraction (EBSD), providing the etch features imaged with reflected LM can be retained during EBSD data ...

Studying Trapped Grains in Alumina using SEM and EBSD

Despite development of high-resolution [1] and in situ [2] microscopies, grain boundaries remain something of an enigma, especially in ceramic materials where second-phase glass is often found to be present as films or precipitates in the interfacial regions. The glass is an unavoidable product in the liquid-phase sintering (LPS) process and incorporates intentional additives and accidental imp...

Determining magnification for reading with low vision.

BACKGROUND In the past, practitioners have used distance and/or near visual acuity (VA) to calculate required magnification for low vision aids. Magnification was usually under-estimated when compared with the final magnification prescribed. Recent studies have emphasised the importance of acuity reserve in determining the required magnification for optimum reading rate. Two different approache...

Optimization of 3D EBSD in a FIB-SEM System Using a Static Sample Setup

1. Laboratoire d’Etude des Microstructures et de Mécanique des Matériaux, LEM3, CNRS ISGMP, Université de Lorraine, F-57045 Metz Cedex 01, France 2. Laboratory of Excellence on Design of Alloy Metals for low-mAss Structures ('LabEx DAMAS'), Université de Lorraine, France 3. Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany 4. Carl Zeiss Microscopy GmbH, Carl-Zeiss Str. 56, 73447 Oberkochen,...

Possibilities and Limits of Phase Identification by Electron Backscatter Diffraction (EBSD) in the SEM